USMT TEST CARD Fdd-lte test card
Product Description
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：ETSI TS 102 221: ’Smart Cards; UICC-Terminal interface; Physical and logical characteristics’ETSI TS 102 221: ’Smart Cards;Card Application Toolkit (CAT)’ETSITS131.111 (3GPP TS 31.111) USIM Application Toolkit(USAT)UICC multi-application platformNew LTE data fields implementedThree applications: Test SIM, Test USIM, Test ISIMBased on Java CardTM Open Platform technology1.8V / 3V / 5V128K EEPROMAPIN 1 disabledGSM XOR/3G test alg.
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- UMTS security variables within the USIM match the default
- Setup time is reduced because the USIM is configured with the same default IMSI and PLMN values broadcast from the Wireless Test Set.
- For dual-mode testing, GSM speech loopback is supported for GSM Bit Error Ratio (BER) measurements.
USIMs support operating voltages of 1.8, 3 and 5 volts (class AB) and you can further modify the USIM's settings using the Gemalto "GemXplore Admin for 2G (with GemXplore 3G Option)" software, which you must purchase separately from Gemalto.
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