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Radio Frequency Probe Pogo Pin RPM700 Series for Electronic Test

Radio frequency coaxial probes are a type of measurement device used for electronic test equipment to measure radio frequency signals of electronic circuits in silicon wafers, die and open microchips. In addition, RF coaxial probes are used in narrow pitch or high density RF interconnect applications in connector assemblies. Transmission lines used in RF applications are usually coaxial cables connected to circuit boards and microstrip lines inside circuit boards.

Features:
Low impedance
High bandwidth
Repeatable measurements
Coaxial design
Interchangeable inner pin

Advantages
Low cost
Best yield
Repeatable accurate test
Long lifespan

Application
Broadband RF measurements
PCBA test
SMA connectors
RF switches
etc.

There is a fixed schedule for mass production of radio frequency test probe RPM700 we will introduce here. This probe is 33.55 mm in total length. This probe can withstand the current up to 1 Amp.

The materials used for the construction of this radio frequency test probe are different for each component:
The barrels are made of brass and phosphor bronze respectively. Subsequently gold and nickel are plated during the galvanic plating phase.
The spring is made of gold-plated music wire.
One plunger is made of brass, then gold and nickel plated. The other plunger is made of POM and beryllium copper plated with gold and nickel.

For details, please check parameters in below table.
Materials (plated)

Specifications

Company Information:
Centalic Technology Development Ltd. was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts, and has a professional manufacturing base owning complete production lines and test equipment.

Our products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.
 
Our company owns professional R&D, production, sales teams under the working principle of 'quality, punctuality, confidentiality' to totally efficiently develop test probes in accordance with the requirements of customers' test projects and meet the needs of customers for mass production as well as developing markets. With many years' continuous endeavour of our staff, Centalic has built a solid foundation in this industry and our products have been sold all over the world. 
 

Our inspection equipment include outer diameter checking machines, profile projectors, one-key inspection instruments, 3 dimension microscopes, AOI machines, spring force testers, vickers hardness testers, Metallurgical microscopes, X-ray plating thickness testers, salt spray testers, life testers, FDR testers, high and low temperature chambers, X-ray perspective inspection machines, network analyzers, HFSS, ADS, LCR meters, DC powers, DC electronic loads, withstand voltage testers, resistance meters, etc.

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Notice:
Stock: standard product. As usual, they are in stock.
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