Model: | AL-3000 |
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Brand: | Aolong |
Origin: | Made In China |
Category: | Industrial Supplies / Other Industrial Supplies |
Label: | xrd , x ray diffraction , x ray diffractometer |
Price: |
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Min. Order: | 1 pc |
Last Online:08 Oct, 2024 |
AL Series X-ray diffractometer is designed for materials reserarch and industrial products analysis. X-ray Powder Diffraction is the perfect combination of conventional analysis with special-purpose measurement products.
X ray diffractometer analyzes natural or synthetic inorganicor organic material, widely used in the field of clay minerals,cement, building materials, environmental dust, chemical products, pharmaceuticals, asbestos, rock, polymer research.
● The perfect combination of hardware and software systems meets the needs ofacademics and researchers in different application areas.
● High precision diffraction angle measurement system obtains more accurateresults.
● High stability of the X-ray generator control system gets more stable repeatabilityprecision.
● Programmable operation,integrated structure design, easy operation,elegantoutlook.
X-ray Powder Diffraction ( XRD ) is a versatile test instrument to reveal the crystal structureand chemical information:
● Unkown samples in a variety of phase identification.
● Mixed samples with known quantitative phase analysis.
● Crystal structure analysis.
● Crystal structure changes under Unconventional conditions (high temperature,low temperature conditions).
● XRD can Analysis on material surface film.
● Analysis on metal material texture and stress.
Technique parameter
Rated power | 3kW |
Tube voltage | 10~60kV |
Tube current | 5~80mA |
X-ray tube | glass tube,ceramic tube,ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW |
Focus size | 1×10mm or 0.4×14mm or 2×12mm |
Stability | ≤0.01% |
Goniometer structure | Horizontal(θ-2θ) |
Radius of diffraction | 185mm |
Scanning range | 0~164 |
Scanning speed | 0.0012°~ 70°/min |
Max.revolving speed | 100°/min |
Scanning fashion | θ-2θ linkage,θ,2θ single action;continuius or stepping scanning |
Angle repeatable accuracy | 1/1000° |
Minimal stepping angle | 1/1000° |
Detector | proportional counters(PC) or scintillation counters(SC) |
Maximal counting rate of linearity | 5×10°CPS(with the compensate function of drop out counting) |
Energy resolution ratio | ≤25%(PC) ≤50%(SC) |
Counting fashion | differential coefficient or integral,PHA automatically,Dead time regulate |
Stability of system measure | ≤0.01% |
Scattered rays dose | ≤1μSv/h(without X-ray protective device) |
Instrument integrative stability | ≤0.5% |
Figure size | 1100×850×1750mm |