Model: | AE-UV1802S |
---|---|
Brand: | A&E Lab |
Origin: | Made In China |
Category: | Industrial Supplies / Chemical Machinery |
Label: | UV Vis Spectrometer , Spectrophotometer , Analytical instrumen |
Price: |
-
|
Min. Order: | 1 pc |
Features:
v With embedded computer and optimized optical
system,convenient and easy to use.
v 320×240 dots array large screen graphic LCD display
with abundant instructions,and curve and table directly
displayed on screen.
v Basic photometric mode, Quantitative analysis
Qualitative analysis, Kinetics test, DNA/Protein Test and
Multi-wavelength are available.
v Alternative fitting and correction methods for Quantitative
Analysis.
v Re-scaling axes, curve smoothing,combination,zooming
and overlap, 1st to 4st derivative for Qualitative analysis.
v Up to 1000 test data can be saved in local memory.
v Data output by optional built-in thermal printer or USB2.0 printer driver and PC software available.
Technical Specifications:
Model |
AE-UV1802 |
AE-UV1802S |
Wavelength Range |
190 - 1100nm |
|
Spectral Bandwidth |
2nm or 1nm (Optional) |
0.5nm,1nm,2nm,4nm,5nm Variable |
Optical System |
Littrow; Grating 1200 line/mm |
Czerny-Turner,Single Beam or Split Beam; Grating 1200 line/mm |
Wavelength Accuracy |
±0.1 nm(656.1 nm D2), ±0.3 nm(Whole wavelength range); |
|
Wavelength Repeatability |
±0.2nm |
|
Wavelength Resolution |
0.1nm |
|
Photometric Range |
0.3 to 3A ; 0-200%T; -9999 to 9999C; |
|
Photometric Accuracy |
±0.002A@0.5A , ±0.3%(0~100%T) |
|
Photometric Repeatability |
±0.001A@0.5A , ±0.15%T(0~100%T) |
|
Stray Light |
≤ 0.05%T (220 nm, NaI; 340 nm, NaNO2) |
|
Baseline Flattness |
±0.001A |
|
Stability |
±0.0005A/hr @500nm, 0A |
|
Photometric noise |
±0.001A (500nm, 0A, 2nm SBW) |
|
Data Output |
320×240 Dots Array Graphic LCD; Optional built-in thermal printer/USB2.0 printer driver; USB1.1 Connecting to computer; |
Pixel lab instrument Ltd. | |
---|---|
Country/Region: | Guang Dong - China |
Business Nature: | Manufacturer |
Phone: | 13434124171 |
Contact: | Susie,Su (salesperson) |
Last Online: | 02 Jun, 2012 |