X-MET5100 combines Oxford Instruments' groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers a five times faster measurement speed, much better detection limits and significant accuracy improvement over conventional systems.
Results obtained in seconds
Portable GPS integration for real-time ore exploration and mine mapping
Measure directly on drill core sample
Certified IP54 NEMA 3 splash and dust proof
Highly accurate multielement ore analysis
User interface in >10 languages
Universal Fundamental
Parameter analysis mode for measurement of ores without known standards
User friendly Empirical Calibration package
Go/No-Go user configurable result format
Rapid data transfer to PC
R ed and reliable tool for fast, accurate analysis

Withstands all weather conditions and rough treatment
IP54 (NEMA 3) approved. Superior dust and moisture protection
High-strength environmentally sealed housing
Long battery operating time, charge indicator on battery and user interface
High performance

Single-shot analysis of all important elements in ore exploration: Fe, Cu, Cr, Zn, Pb, Mn, Ni, Co, Mo, Ta, W etc.
Rapid analysis with typical easurement times of 10 – 30 seconds (X-MET5000) or 2 – 5 seconds (X-MET5100) depending on the elements of interest and required precision
Low detection limits, X-MET5000 can typically detect 5 – 30 ppm concentration with 120s measuring time.
X-MET5100 detection limits are even lower and ppm level analysis can be done in just 10 – 30 seconds
High speed automatic averaging – calculate averages of 2 – 50 measurements and save both individual results and average results in a log file
Choice of analysis modes

Fundamental Parameter Calculations when standards are not available
Universal calibration to measure over 30 elements between Cl-U
Suitable for wide range of ore types
Empirical Calibration available for optimized accuracy
Create custom calibrations on-site with optional PC software package
Sample measurement is fast and simple
Direct on-site surface measurement for quick pre-screening without sample preparation
Measure from a plastic bag or sample cup in bench-top mode