The socket is designed for test, debug, validation, and programming of eMMC, eMCP devices

The socket provides a compact test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV product development.

Test, debug, validation, and programming of  eMMC, eMCP devices

Failure analysis / System and wafer test

Package and Chip qualification

Feature:

Change the sliding friction to rolling friction for the latch, Keep the high accuracy & long life for the clamshell lid.

Pusher with adjustable design, protect the pogo pin & compatible eMMC devices tickness 0.8mm ~ 1.5mm.

Special latch design, very easy operation.

Contacts with pogo pin, long life & stable performance.

Body with engineering plastic, high quality.

Floatingdesign, protect the pogo pin & high accurate positioning.

Contacts can be replaced, easy maintenance & low cost for the replacement.

Specification:

Mechanical

Socket Body: PPS
Socket Lid: AL
Contact: Spring Probe
Operation Temperature: 0ºC to 80ºC
Life Span at Operating Travel:50K min.
Cycles Spring Force:24.5g per Pin

Electrical
Current Rating (Continuous) : 2A
DC Resistance: 100mohm