Product introduction

The PCT aging box (also known as the PCT high pressure accelerated aging test machine) is mainly to test the moisture capacity of semiconductor packaging. The products to be measured are tested under severe temperature, humidity and pressure. Moisture will infiltrate into the packaging body along the interface of colloid or colloid and wire rack. The common fault formula is caused by active metallization. Circuit breakage, or short circuit between package leads due to contamination.

Product application

Widely used in circuit boards, multi-layer circuit boards, IC, LCD, magnets and other products of sealing performance testing, testing its products of pressure resistance, air tightness. The purpose of accelerated aging test is to improve the environmental stress (such as temperature) and working stress (applied to the product voltage, load, etc.), speed up the test process and shorten the life test time of the product or system.

Semiconductor testing

The PCT test box tests the PCT of Semiconductors: the most important is to test the anti moisture capacity of the semiconductor package, the test product is tested under the harsh temperature, humidity and pressure environment. If the semiconductor packaging is not good, the moisture will infiltrate into the sealing body along the interface of the colloid or colloid and wire rack. The common reason for loading is the explosion. Problems such as rice flower effect, breakage caused by corrosion in moving metallization area, short circuit caused by pollution due to contamination between package leads.