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Jointed Test Finger IEC61032 figure 2 Test Probe 1Jointed Test Finger IEC61032 figure 2 Test Probe 2
  • Jointed Test Finger IEC61032 figure 2 Test Probe 1
  • Jointed Test Finger IEC61032 figure 2 Test Probe 2

Jointed Test Finger IEC61032 figure 2 Test Probe

Model:AUTO-B
Brand:AUTO
Origin:Made In China
Category:Electronics & Electricity / Electronic Instrument / Laboratory Instrument
Label:Access and Object Te , Test Fingers & Test , Product Safety Testi
Price: US $280 / pc
Min. Order:1 pc
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Detail

Product Description

 Standard Jointed Test Finger IEC61032 figure 2 Test Probe B

 

 

1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)

 

This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.
It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.  

 

                                          

                  Detail

2. Rígid Test Finger (Figure 7 / Test Probe 11 / IEC 61032)

 

Rigid Test Finger is a precision probe made according to Figure 7 (Fig. 7) of the IEC 61032 (Test probe 11) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL.

 

                             

              Detail

3.Test Finger Nail (Figure 7 / IEC 60335-1)

 

Test Finger Nail is a test device designed to simulate a human finger nail. Test Finger Nail is designed and manufactured according to Figure 7 of IEC 60335.

 

   

 

4.Specifications:

  • Material of construction: Steel.
  • Finishing treatment: Chrome plating.
  • lineal dimension: Millimeters.
  • Reference: IEC 61032.
  • Reference: IEC 60335-1.
  • Reference: IRAM 4220-1.

5.We offer a wide range accessibility probes and many of them are in stock.

 

Accessibility Probes Series
CSA C22.2 No12 Fig.1 EN18386 IEC60598-1 cl... 8.2.1 UL1310
IEC61032 Fig.1 IEC61032 Fig. 2 UL1310 Fig 16.4(S3252)
IEC61032 Fig. 3 IEC61032 Fig. 4 UL1278 Fig. 8.3,
IEC61032 Fig. 5 IEC61032 Fig. 6 UL1278 Fig. 8.4
IEC61032 Fig. 7

IEC61032 Fig.8 /I08A / IS: 5790-1985

cl. no. 8.101, figure no. 101

UL1278 Fig 8.1(PA130A)

IEC61032 Fig. 9 IEC61032 Fig. 10 UL1278 Fig 8.2(PA140A)         
IEC61032 Fig. 11 IEC61032 Fig. 12 UL1278 Fi 9.1(PA160),
IEC61032 Fig. 13 IEC61032 Fig. 14 UL1278 Fig  10.1
IEC61032 Fig. 15 IEC61032 Fig. 16 UL1278 Fig 10.2       
IEC61032 Fig.17 IEC60335.1 cl. 3.6.3  UL1278 Fig 10.3
IEC60335-1 cl. 20.2 IEC60335-2-14 cl. 20.2 UL1278 fig 10.4
IEC60335.1 cl. 8.1.3 IEC60335-2-24 cl. 21.102;  UL507 Fig 9.2
IEC60335-2-25 cl. 22.105 IEC60335 Fig. 7  UL507 Fig 9.2(PA160B)  
IEC60335-2-24 Fig. 102 IEC60529 Probe A /B/C/D UL507 Fig 8.2(S2140)
IEC60950 Fig. 2A IEC60950 Fig. 2B UL507 Fig 9.1(PA135A)
IEC60950 Fig. 2C

UL60950 Fig  NAF.2 e  NAF.3

UL982 Fig7.1,

IEC60065 Fig. 4 IEC60065 Fig. 8;       UL982 Fig 58.2
IEC60065 Fig. 6 IEC60065 cl. 9.1.3;        UL499 Fig 6.48.2(PA170B)
IEC60884 Fig. 9 IEC60884 Fig. 10;      IEC60598-2-20 cl. 22.11.2

 


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Jointed Test Finger IEC61032 figure 2 Test Probe 1
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Jointed Test Finger IEC61032 figure 2 Test Probe 2
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Shenzhen Autostrong Instrument Co., Ltd.

West Of Floor 4, Huafeng High Tech Industry Zone, Nanhuan Rd. Binhai Rd. Crossing, Shajing St., Baoan District, Shenzhen, Guangdong, China (Mainland)

Phone:
86-755-26562926
Fax:
86-755-26978981
Contact:
SURI (Manager)
Mobile:
18675551810

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