IEC61032 Test Probe B
1.Application:

This is the “International” test finger required by most IEC, EN and CSA Standards, in addition to many UL Standards. Built in strict accordance to the newest requirements – with integrar   palm simulator.                    
This jointed test probe is strictly designed and manufactured according toIEC61032 , IEC60335, IEC60529 and GB/T4208,GB4706.1,GB/T16842 standards.
This is the ONLY Finger Probe available with a integral jack in the handle for continuity testing -as  mandated by the IEC CB Scheme.  Finger  is made of chrome plated steel/stainless steel. All parts precision  machined.
Test Finger Probe is intended to verify protection of persons against access to hazardous parts for an IP1 Code. Also used to verify protection from access with the back of the hand for an IP suffix A code.
2.Technical  paremeter:
Knurled finger diameter 12mm
Knurler finger  length 80mm
Baffle  plate diameter 50mm
Baffle  plate length 100mm
Reference IEC60065, IEC 60335-1, IEC 60529, IEC60884-1, IEC60950,  IEC61032, IEC69745-1