The SD solution is designed for test, debug, validation, and programming of eMMC, eMCP devices

The SD solution provides a compact test solution for eMMC, eMCP devices used in applications such as handheld, mobile, and TV product development. 

Test, debug, validation, and programming of  eMMC, eMCP devices

Failure analysis / System and wafer test

Package and Chip qualification

Production prototype / Data recover

Feature:

Suitable for devices of  Samsung, Hynix, Sandisk, Toshiba, Intel, Kingston etc eMMC and eMCP.

Support eMMC version: ≤eMMC5.0.

Support hot plug, eMMC can be directly connected to PC with SD card reader.

Realize reading, accessing and writting data for eMMC and eMCP devices