Atomic force microscope

Features of Atomic force microscope:

1.  Integrated scanning probe and sample stag enhanced the anti-interference ability.

2  Precision laser and probe positioning device make changing the probe and adjusting the spot simple and convenient.

3. By using the sample probe approaching manner,the needle could perpendicular to the sample scanning.       

4.   Automatic pulse motor drive control sample probe vertical approaching, to achieve precise positioning of the scanning area.

5.   Sample scanning area of interest could freely moved by using the design of high precision sample mobile device.

6.   CCD observation system with optical positioning achieves real-time observation and positioning of the probe sample scan area.

7.   The design of electronic control system of modularization facilitated maintenance and continuous improvement of circuit.

8.   The integration of multiple scanning mode control circuit, cooperate with software system.

9.    Spring suspension which simple and practical enhanced anti-interference ability.

Technical parameter