AFM6800 Atomic force microscope 

Features of Atomic force microscope:

1:  Optical,mechanical and electronic integration, simple outline structure.

2: Integrated scanning probe and sample stage improves the anti-interference ability.

3:  Precision laser and probe positioning device make changing the probe and adjusting the spot simple and convenient.

4: Different with other suppliers, our device changes the sample probe approaching sample mode to the sample approaching probe mode. It’s a really efficient way to protect the cantiliver broken from miss operation.

5. Automatic step motor drive controls the sample probe vertical approaching, to achieve precise positioning of the scanning area.

6. Sample scanning area of interest may be freely moved by using an high precision wide-range X-Y stage.

7. High precision and wide range piezo-scanner, multiple choice according to different precision and scanning range .

8. 10xapochromat CCD optical positioning system achieve real-time observation and positioning of the sample scan area.

9. The design of the modular electronic control system facilitates maintenance and continuous improvement.

10.  The integration of multiple scanning mode control circuit,cooperate with software system.( Windows98/2000/XP/7/8)

Technical parameter