IC high temperature dynamic burn-in system
Product Description
Compliances: GJB548 standard (corresponding to
MIL-STD-883)
GJB597 standard (corresponding to
MIL-M-38510)
Applications: Applicable to high-temp and dynamic
burn-in tests for integrated circuits such as various
digital, analog, digital and analog kinds, and SOC
circuits, microprocessors, memories, etc.
Specifications:
Model V
Zone 16 zones(standard)
Testing capacity 208*16
Testing
temperature
150 up to 150
Digital signal
Each board has 64 channels, each of which can edit data, adress and tri-state properties of
signal; signal frequency up to 2MHz; minimum program resolution is 100ns; minimun
program length is 100ns; program depth is 256k; signal width program range is 2.0V-18.0V;
Maximum adress length is 64G; digit signal can program by direct input, character input and
procedure input.
Analog signal
4 channels of anolog signal generate unit and driving circuit. Maximum frequency is 1MHz;
Maximum driving current is 1A; Signal width is Vpp20V; DC deviation value is 0-1/2Vpp.
Test condition
monitor 64 channels signal monitor interface; wide range digital and analog signal frequency
auto-test and record; secondary power voltage monitor.
Secondary prower current, signal peak monitor (optional)
Communication
rate
500K
Secondary power
supply
Programmable VCC,VMUX, VEE; OUTPUT:2V-18V/10A; sink current ability is available.
AC380V,50Hz,three phase (220V single phase is optional)
under 8kW
Weight
about 500kg
Size 1313mm*1950mm*1350mm
Product Image
Img 1
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