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The Nippon Takaya APT-1400F Series is a single-sided test flying probe tester with 6 flying probes, 2 of which are vertical probes that access previously inaccessible contact points. It can handle component heights up to 60 mm and board weights up to 10 kg, making it suitable for testing large and heavy substrates such as automotive, aircraft and medical equipment, as well as power supply boards and probe cards.

It has been specially developed for testing complex boards and high volumes. With an outstanding measurement unit and numerous innovative test algorithms that significantly improve board test coverage, TAKAYA enjoys the world's largest market share in the industry of flying probe test systems for printed circuit board assembly (PCBA), which can have a significant effect on reducing inspection costs and improving quality in assembly lines, regardless of the type of substrate and production volume.

Specifications

Number of probes 4 pcs + 2 vertical probes

Up to 350,000 inspection steps

Measuring speed 0.02 sec/step

Minimum contact pad size 60 microns

Repeatability of probe positioning ±25µ~

Minimum probe pitch 0.15 mm

Measurable size L540xD483mm/W635xD610mm

Expandable to 890x483mm/W985×D610 mm, optional

Power supply/air supply: AC200~240V (single phase)

50/60Hz, max. 2.8kVA Air

: 0.6~0.8Mpa (dry air)

Size, weight W1400×D1500×H1400mm 1350kg

(Inline machine 1400kg)

Measuring range

DC voltage/current ± 125V/±1A (optional: up to ±2A)

AC Voltage 150mV ~ 75Vrms, f = 10Hz ~ 0.5MHz

Frequency 1Hz ~ 20MHz / 2V ~ 20Vp-p

Resistance 5mΩ ~ 50MΩ *Customized 2mΩ~

Capacitance 0.5pF ~ 200mF

Inductance 0.5μH ~ 500H

Impedance/Phase Angle 2.5Ω ~ 3.3MΩ / ±90°

Trance Inductance, Winding Ratio, Phase Difference

PN Junction VF Measurement 0.1V ~ 40V

Zener Diode Voltage 0.1V ~ 40V (Optional: up to 80V)

Open check can set threshold 5 Ω ~ 50MΩ (standard 100 Ω or more)

Short check can set threshold 1 Ω ~ 500KΩ (standard 10Ω or less)

Diode/Transistor/Field Effect Tube PN Junction VF Measurement, ON Test, Gain, Characterization

Relay/Opto-coupler/Switching element ON test